Specifications:
– HT: 0.1 ÷ 30 kV
– Max. beam current > 600 nA
– Resolution: 1 nm@30 kV, 1.6 nm@1 kV
– Detectors: SE, BSE, In-lens SE and BSE
– Analytical detectors: WDX, EDX, EBSD/TKD“ Key Features:
– In-lens Schottky FEG
– Through-the-lens detectors with energy filter
– Aberration correction lens Application:
– Imaging
– Spectroscopy: EDX, WDX
– Diffraction Location: RUB, ZGH Group: ZGH Contact: Dr. Aleksander Kostka Email:aleksander.kostka@ruhr-uni-bochum.de Usage Conditions:
– Obligatory ZGH laboratory safety introduction
– ZGH registration and complete training on the instrument (fee is applied)
– Self operation (preferred) and service (lab supervisor assistance) session are allowed. Use fee are applied depending on time and selected kind of service More details at „ZGH Benutzungsregeln Mikroskopie document“
Specifications: — Key Features: — Application: — Location: RUB, NB Group: EP IV Contact: Prof. Anna Böhmer Email:sekretariat-ep4@physik.rub.de Usage Conditions: —
Specifications: — Key Features:— Application: — Location: RUB, IC Group: HAM Contact: Prof. Dr.-Ing. Jan T. Sehrt Email:ham@ruhr-uni-bochum.de Usage Conditions: —
