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Home » Research » Research at MRD » Privat: Infrastructure » Characterization

- Ruhr-Universität Bochum

Infrastructure

Characterization

10 T superconducting magnet system with VTI insert
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

17 T superconducting magnet system with 3He insert
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

3D-Scan
  • GOM Atos Core 200

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

Alcln: Temperture-programmed surface reactions with ammonia and hydrocarbons
  • not set

    Specifications:

    • Transient experiments with diluted ammonia and 2-propanol
    • Controlled redcution, desorption, surface reaction according to temperture programm
    • Temperature up to 650 °C
    • QMS as gas analyzer

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Atom Probe
  • LEAP 500 XR

    Location: RUB, ZGH
    Group: ZGH
    Contact: Dr. Yujiao Li
    Email: yujiao[dot]li[at]ruhr-uni-bochum[dot]de

Atomic Force Microscopy
  • Bruker Resolve

    Specifications: PeakForce Tapping, electrochemical AFM, MFM, conductive AFM, force-distance measurements

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

  • JPK Nanowizard

    Specifications: electrochemical AFM, MFM, conductive AFM, force-distance measurements

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

ATR-SEIRAS barrier electrochemistry
  • Veemax III and Jackfish cell

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Autocorrelation measurement system
  • not set

    Specifications: including FROG

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Betsy: Synthesis from high pressure syngas
  • not set

    Specifications:

    • Catalytic studies with high pressure syngas
    • Online GC analysis with double FID and single TCD
    • Up to 400C and 60 bar
    • Sophisticated analysis of permanent gases, oxygenated products and hydrocarbons
    • Fixed bed with up to 250 mg of catalyst

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Bipotentiostatic measurements
  • Autolab

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Catalytic oxidation of CO
  • not set

    Specifications:

    • Catalytic oxidation of CO
    • Vertical fixed bed reactor
    • Analysis of effluent gas of CO, CO2, O2

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Catalytic redox reactions in the liquid phase under high pressure
  • not set

    Specifications:

    • Liquid-phase oxidation and hydrogenation reactions under high pressure
    • Pressure up to 200 bar
    • Temperatures of up to 300 °C
    • Dedicated line for sampling during operation

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Chipping pendulum
  • not set

    Specifications:

    • Chip speeds up to 395 m/min
    • Web width/length: 2.5 mm * 100 mm
    • Chip depth: up to approx. 0.7 mm

    Application: Modelling the cutting of materials

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

CO oxidation and VOC oxidation over fixed bed and over thin coatings
  • not set

    Specifications:

    • Coupled with a QMS and a NDIR detector for CO and CO2
    • U-tube quartz reactor with inner diameter of 4 mm and stainless-steel plate reactor
    • Aluminum block oven with a temperature of up to 450 °C and plate reactor with a temperature of 650 °C

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

CO2RRECT: Catalytic effect on biomass conversion
  • not set

    Specifications:

    • Investigation of the catalytic effect on biomass conversion
    • Oxidation and CO2 gasification
    • Vertical fixed bed reactor with sample placed on a frit
    • Split tube furnace capable of 1300 °C
    • Fast quenching by removing the furnace from the reactor
    • Analysis of effluent gas of CO, CO2, CH4, O2

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Combined differential thermal analysis/thermogravimetry
  • TA Instruments SDT 650

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

Confocal Microscope
  • not set

    Specifications:

    • self-made
    • resolution: lateral up to 500nm, axial up to 4um

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

  • not set

    Location: RUB, ID
    Group: MST
    Contact: Prof. Dr.-Ing. Martin Hoffmann
    Email: martin[dot]hoffmann-mst[at]rub[dot]de

  • NanoFocus µsurf Explorer

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

Contact Angle Instrument
  • Contact Angle Instrument

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

Continuous flow- and bath cryostat with 0.6 T magnet
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

Corrosion analysis
  • Büchi Miniclave steel

    Specifications: 100bar, 200°C

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Dark field microscopy
  • not set

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

DC precision semiconductor parameter analyzer
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

Differential scanning calorimeter
  • Netzsch DSC 204 F1 Phoenix

    Application: Determination of heat capacities (~140 K to 1673 K)

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

Differential Scanning Calorimetry
  • Linseis HDSC PT-1600

    Specifications:

    • measuring temperature: approx. 150°C to 1550°C
    • Atmospheres: Dynamic helium atmosphere
    • Samples: Solids, powders and liquids measurable
    • Per measurement approx. 50-150 mg

    Application:

    • Kinetic observation of reactions
    • Measurement of specific heat capacity
    • Measurement of phase transformations

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Diffuse reflection IR-Spectroscopy (DRIFTS)
  • ThermoFisher Nicolet i20 (up to 1000°C)

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

Digital holographic microscope
  • not set

    Specifications:

    • self-made
    • resolution: lateral up to 1um, axial up to 20nm

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Digital Microscope
  • Keyence VHX-6000

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

Dilatometer
  • Netzsch DIL402C

    Application: Determination of thermal expansion coefficients between 100 K and 1773 K.

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

DLS and zeta potential measurements
  • Malvern, Zetasizer Nano ZS

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

  • Wyatt, DynaPro NanoStar

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

DSC with Tian-Calvet calorimeter coupled with QMS
  • not set

    Specifications:

    • DSC unit with Tian-Calvet calorimeter measuring heat flow in experiments up to 835 °C
    • Continuous supply of He, O2, CO2 as well as pulsing of these gases
    • Sample (ca. 60 mg) placed on a frit in a vertical fixed bed reactor
    • TPD unit equipped with a U-tube reactor inside heatable steel plates
    • TPD experiments with CO2 and NH3 up to 800 °C
    • Quantification of CO, CO2, NH3, O2 and additional identification by QMS

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Electrochemical quartz crystal microbalance
  • not set

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Elemental analyser
  • ELTRA CS800

    Specifications:

    • Measurable elements: carbon, sulphur
    • Sample type: inorganic
    • Sample carrier: burnt-out ceramic crucible
    • Application: metals, rocks, ceramics
    • Furnace type: induction furnace for temperatures up to over 2000 °C
    • Furnace orientation: vertical
    • Measuring principle: Infrared absorption
    • Number of infrared cells: 1-4
    • Infrared path material: Aluminium
    • Typical analysis time: 40 s
    • Catalyst: Platinum
    • Required additives: Oxygen/compressed air, combustion additives, filter materials.

    Application: Determination of: Carbon content, Sulphur content

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Ellipsometer
  • not set

    Location: RUB, ID
    Group: MST
    Contact: Prof. Dr.-Ing. Martin Hoffmann
    Email: martin[dot]hoffmann-mst[at]rub[dot]de

  • Accurion

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

Fast pyrolysis of biomass in helium coupled with GC/MS-GC/TCD
  • not set

    Specifications:

    • Primary and secondary pyrolysis products
    • Heating rates of 1000 K/s, temperatures up to 1050 °C
    • Multidimensional GC analysis, qualitative anaylsis of tars and light gases
    • Calibrated for CO, CO2, CH4, C2H6, C2H4
    • Sample amounts below 1 mg

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Femtosecond-atomic force microscope
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Feritscope
  • MP30

    Specifications:

    • Destruction-free measurement of magnetic contents in austenitic alloys in the range of 0.1-80 vol.%.
    • Tapered measuring range (2-3mm) into the sample volume
    • Measurement according to Basler standard and DIN EN ISO 17655

    Application:

    • Non-destructive measurement of magnetic components (ferrite/martensite content) in austenitic alloys.
    • Ex: Inspection of austenitic welds, pressure vessels, claddings or duplex steels.

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Flat Flame Burner
  • not set

    Specifications:

    • Fast pyrolysis of biomass-based samples in CH4/air flame
    • Heating rates of 1000 K/s, Temperatures around 1400 °C
    • Continuous feeding of solid fuels
    • Flame sampling at variable heights

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

FMCW radar system for imaging
  • not set

    Specifications: reflection and transmission imaging at approx. 300GHz

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Focused Ion Beam
  • not set

    Location: RUB, NB
    Group: AFP
    Contact: Prof. Andreas D. Wieck
    Email: lsafp[at]ruhr-uni-bochum[dot]de

  • FEI Helios G4 CX

    Specifications: Electron optics

    • HT: 0.2 ÷ 30 kV
    • Beam current 0.8 pA ÷ 22 nA
    • Resolution: 0.8 nm@15 kV, 1.4 nm@1 kV
    Ion optic
    • HT: 0.1 ÷ 30 KV
    • Beam current 0.1 pA ÷ 65 nA
    • Resolution: 4.0 nm@30 kV

    Features:

    • Schottky FEG
    • Independent Pt and carbon GIS
    • EasyLift EX NanoManipulator
    • Stage Navigation system
    • Charge neutralizer

    Application:

    • Target sample preparation: Etching/milling, Pt/carbon deposition, In-situ sample transfer
    • Imaging
    • Spectroscopy & Diffraction

    Location: RUB, ZGH
    Group: ZGH
    Contact: Dr. Yujiao Li
    Email: yujiao[dot]li[at]ruhr-uni-bochum[dot]de

Four Point Probe
  • Four Point Probe (Jindal)

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

Glow discharge spectrometer
  • GDA 650HR

    Specifications:

    • Anode diameter: 2.5 mm
    • Quantitative detection of all alloying elements (also C, N, O, H)
    • Measurement of metallic and non-metallic samples
    • Depth profile analysis up to 200 µm
    • High-frequency pulsed measurements possible
    • Sample cooling
    • Gas supply: Argon

    Application:

    • Chemical quantitative bulk analysis of solid metallic and non-metallic samples.
    • Chemical quantitative depth profile analysis of coatings, edge layers
    • Determination of (edge) layer thicknesses

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Golay cell /pyroelectric detectors
  • not set

    Specifications: FIR

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Hardness tester
  • KB30S

    Specifications: Manufacturer: KB Prüftechnik GmbH

    • Max. Test piece weight: 120kg
    • Projection: 170 mm
    • Test space height without cross table: 245 mm
    • Test space height with cross table: 170 mm
    • Battery LED illumination > 10 years
    • Magnification zoom: 1:7 in 10 steps
    • Resolution Z-axis: 0.005 µm
    • Weight without stage: 61kg
    • Weight with stage: 71kg
    • Cross table travel: 180x160 mm

    Application:

    • Quick and precise measurement of individual indentations using autofocus and automatic evaluation.
    • Measurements in the load range between macro, small load or micro hardness 0.005kg - 62.5kg
    • Hardness mapping and trajectories on large samples and workpieces, using the automated cross table and overview camera
    +

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

  • Wolpert

    Specifications:

    • Measurement methods: Vickers and Brinell
    • Test load (Vickers): 1 / 5 / 10 / 30
    • Degree of stress (Brinell): 1 / 2.5 / 5 / 10 / 15 / 30

    Application:

    • Hardness measurements in the macro and micro range
    • hardness measurements on soft and hard materials

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Hardware-in-the-Loop Systems
  • dSPACE

    Application:

    • Active Vibration Control (AVC)
    • Active Structural Acoustic Control (ASAC)
    • Design, optimization, verification, testing and implementation of smart structures and systems
    • Model and system identification

    Location: RUB, IC
    Group: MAS
    Contact: Prof. Dr.-Ing. Tamara Nestorović
    Email: mas[at]rub[dot]de

Heated strip reactor for fast pyrolysis of biomass
  • not set

    Specifications:

    • Fast pyrolysis of biomass-based samples in N2 and CO2
    • Heating rates of 1000 K/s, Temperatures up to 1400 °C
    • Collection of tar and char
    • Primary pyrolysis products
    • Sample amounts of about 100 mg

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

High Temperature Nanoindenter
  • TESCAN VEGA 3 + Nanomechanics InSEM HAT

    Location: RUB, ZGH
    Group: ZGH
    Contact: Dr. Janine Pfetzing-Micklich
    Email: janine[dot]pfetzing[at]ruhr-uni-bochum[dot]de

High-pressure dosing experiments for methanol synthesis
  • not set

    Specifications:

    • Long-term experiments on the catalyst deactivation in methanol synthesis by catalyst posions like S-components
    • Nearly the whole set-up is coated with silconert 2000 to withstand the corrosive S-components
    • FTIR and MicroGC for analytics
    • 1 inch reactor

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

High-resolution electron energy loss spectrometer
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

High-temperature sliding wear test bench
  • SRV®4 Optimol

    Specifications:

    • Manufacturer: Optimol Instruments Prüftechnik GmbH
    • force: max. 100 N
    • Temperature: max. 600 °C
    • Protective gas supply: Ar
    • Sample dimensions: 10x10x4 mm (LxWxH)
    • Counterbody: any

    Application:

    • Hot hardness measurement up to 600 °C
    • sliding wear behaviour up to 600 °C

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Hot wear test stand
  • not set

    Specifications:

    • Manufacturer: Fluid-Kotthoff GmbH
    • Sample size and shape: Rectangular discs measuring 40 x 21.5 x 5 mm
    • Rotation speed: 40 rpm
    • Temperature range: 20-600°C
    • abrasive: corundum of grain size F8 (2.2-2.8mm); quartz sand of various grain sizes

    Application:

    • Measurement of abrasive wear of materials at temperatures from 20 - 600°C.
    • Tests under air and under argon atmosphere

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

HPLC 2
  • not set

    Application: liquid phase analysis

    Location: RUB, NC
    Group: AC8
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Imaging cameras
  • not set

    Specifications: Vis and IR

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Impact hammer
  • Wolpert PW30

    Specifications:

    • Pendulum energy: 150 J to 300 J
    • Instrumented force measurement with DMS

    Application:

    • Determination of the impact strength of a material
    • Measurement of force-displacement curves of the test

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

In situ Diffuse Reflectance Infrared Spectroscopy
  • Thermo Fisher Nexus

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

In situ Diffuse Reflectance Infrared Spectroscopy for Toxic Solids and Liquids
  • Nicolet Protege 460

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Interference microscope
  • not set

    Location: RUB, ID
    Group: MST
    Contact: Prof. Dr.-Ing. Martin Hoffmann
    Email: martin[dot]hoffmann-mst[at]rub[dot]de

IR spectrometer
  • Nicolet 6700

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

IR-Camera
  • Optris PI 640

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

JT-SPM
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Laser Scanning Microscope
  • Olympus LEXT OLS 5000

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

Lensless digital holographic microscope
  • not set

    Specifications: self-made

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Light microscope
  • Leica Limi DM6 M

    Specifications:

    • magnification levels: 25x / 50x / 100x / 200x / 500x / 1000x
    • Operation: Analogue and digital
    • Camera: 4.9MP
    • Remote capable
    • Panoramic image creation possible
    • Output of parameter histogram
    • Function for multifocus integrated
    • DIC contrast adjustable

    Application:

    • Examination of ground sections
    • Preparation of specimen images
    • sizing of individual sample components
    • Checking the preparation process
    • Compensation for poor plane parallelism
    • Reproduction of image parameters
    • Live feed through remote function

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Low temperature scanning tunnelling microscope
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Microscopic FTIR
  • not set

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Mobile X-Ray-Diffraction
  • Pulstec µ-X360n

    Specifications:

    • Use of the Cos α-method
    • Operating voltage/current: 30 kV, 1 mA
    • Collimator sizes (measuring range): 0.3/0.5/1.0/2.0 mm
    • Cr tube with Be window λ = 2.30 - 10-10 m
    • penetration depth of X-rays in steel: dein ~ 5 µm
    • measuring time: 5 - 120 s
    • Size: 20x20x50 cm

    Application:

    • Analysis of: Fe-base, Al-base and Ni-base materials.
    • Measurement of residual stresses
    • Measurement of the retained austenite content
    • Measurement of delta-ferrite in austenitic materials

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Modal analysis
  • Brüel & Kjær system

    Application: hammer and shaker tests

    Location: RUB, IC
    Group: MAS
    Contact: Prof. Dr.-Ing. Tamara Nestorović
    Email: mas[at]rub[dot]de

Modular system for machine diagnostics
  • not set

    Application:

    • critical rotational frequencies
    • balancing
    • damage detection

    Location: RUB, IC
    Group: MAS
    Contact: Prof. Dr.-Ing. Tamara Nestorović
    Email: mas[at]rub[dot]de

Mössbauer Spectroscopy
  • not set

    Specifications: SeeCo Mössbauer system with a Janis cryostat for handling samples down to liquid He temperatures.

    Location: RUB, NC
    Group: AC5
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Multimode atomic force microscope
  • DI-Instruments

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Multiscale scanning tunnelling microscope
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Nano scribe with AFM
  • not set

    Specifications:

    Nanoritzer:

    • Max. Load: 10 µN to 1 N
    • Load resolution: min. 0.15 µN
    • Max. Frictional force: 1 N
    • Frictional force Resolution: 0.3 µN
    • Max. Penetration depth: 1 mm
    • Depth resolution: 0.3 nm
    • Scoring speed: 0.4 - 600 mm/min

    AFM:

    • A - planar, max. Ø 10 mm, thickness max. 3 mm.
    • B - embedded samples max. Ø 10 mm, thickness max. 8 mm; non-embedded samples need not have a specific geometry

    Application:

    • Determination of local mechanical properties
    • Empirical calculation of the f_AB value
    • Determination of the surface topography

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

  • not set

    Specifications:

    Light microscope:

    • 5x, 20x, 50x and 100x objective lens
    • Digital image capture with 1024x768 pixels

    Nano-scriber:

    • Max. Load: 10 µN to 1 N
    • Load resolution: min. 0.15 µN
    • Max. Frictional force: 1 N
    • Frictional force Resolution: 0.3 µN
    • Max. Penetration depth: 1 mm
    • Depth resolution: 0.3 nm
    • Scoring speed: 0.4 - 600 mm/min

    AFM:

    • A - planar, max. Ø 10 mm, thickness max. 3 mm.
    • B - embedded samples max. Ø 10 mm, thickness max. 8 mm; non-embedded samples need not have a specific geometry

    Application:

    • Determination of local mechanical properties
    • Empirical calculation of the f_AB value
    • Determination of the surface topography

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Nanoindentation
  • Nanomechanics Inc. iMicro

    Specifications:

    • capacitive deflection measurement
    • deflection 80 µm
    • deflection resolution 0.04 nm
    • Maximum load 1000 mN
    • load resolution 6 nN
    • Indenter normal stiffness 80 N/m
    • Damping coefficient 0.005 N s/m
    • Resonance frequency 120 Hz
    • Drift rate <0.05 nm/s
    • Data acquisition rate 100 kHz
    • CPU control rate 500 Hz
    • Time constants > 20 µs
    • excitation frequencies 0.1 Hz - 1 kHz

    Application:

    • determination of local mechanical properties
    • hardness, E-modulus, fracture toughness

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Near Ambient Pressure X-ray Photoelectron Spectroscopy
  • not set

    Specifications:

    • UHV-XPS measurements
    • high temperature cell
    • Operando-measurement under reaction at high pressure (mbar)
    • In situ cell for electrochemistry

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Netzsch STA-409 TG-DSC
  • not set

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

NH3 splitting for hydrogen production
  • not set

    Specifications:

    • Coupled with GC and multi-channel analyzer (NH3, H2O, H2)
    • Temperature range up to 1000 °C
    • Long-term stability and deactivation kinetics
    • 1/2 inch stainless-steel reactor with SilcoNert coating

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Nitrogen Physisorption (BET-BJH)
  • not set

    Specifications:

    • Four Autosorb instruments available
    • Two additional pre-treatment units
    • Determines specific surface area and pore size distribution

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

OCT systems
  • not set

    Specifications: Commercial and self-developed

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Offline Gaschromatography
  • Shimadzu GC-MS QP2020

    Specifications: equipped with a HS-20 Headspace Sampler

    Location: RUB, NC
    Group: AC7
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Online Gaschromatography
  • Agilent 7820A GC System

    Specifications: equipped with a methanizer for gas analytics

    Location: RUB, NC
    Group: AC6
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Opeando Thin-Layer ATR-FTIR Spectroelectrochemical Flow Cell
  • Bruker Tensor 27

    Specifications:

    • Operando acquisition of ATR-IR spectra under electrochemical measurements
    • Precise control of distance and angle between electrode and ATR cell

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Optical emission spectrometer
  • OBLF QSG750

    Specifications:

    • sample size: height 0.01 - 10 cm; diameter min > 8 mm
    • Analysis of: Al-, Co-, Cu-, Fe- as well as Ni-based alloys.
    • Special features: Detection of the light elements N and B possible
    • Protective gas: argon

    Application: Fast and complete analysis of the chemical composition of metallic alloys

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Optical Microscope
  • Nikon Eclipse LV 1000

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

optical microscopes
  • not set

    Location: RUB, ID
    Group: MST
    Contact: Prof. Dr.-Ing. Martin Hoffmann
    Email: martin[dot]hoffmann-mst[at]rub[dot]de

Optical microscopy
  • Zeiss, Axioscopy, Bresser

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Optical power meters
  • not set

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Optical Spectrometers
  • not set

    Specifications: thermal and LN2-cooled cameras with single channel detectors (LN2-Si-CCD, LN2-InGaAs-OMA, LN2-Ge detector, …)

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Optical spectrum analyser
  • not set

    Specifications: 350 - 1750nm

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Oxford X-Calibur-3 single crystal XRD
  • not set

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

Penetration test
  • Nanomechanics iMicro

    Specifications:

    Accusator:

    • Deflection measurement: capacitive
    • Deflection range: 80 µm
    • Deflection resolution: 0.04nm
    • Noise: < 0.1 nm
    • Load application: coil/ magnet
    • Maximum load: 1000 mN
    • Load resolution: 6nN
    • Typical indenter normal stiffness. 80N/m
    • Damping coefficient: 0.005N*s/m
    • Typical resonant frequency: 120Hz
    • Drift rate: < 0.05 nm/s

    Controller:

    • Data acquisition rate: 100 kHz
    • Closed-loop CPU control rate: 500 Hz
    • Time constants: > 20 µm
    • Dynamic excitation frequencies: 0.1 Hz to 1 kHz

    Application: Spatially resolved determination of: Hardness, E-modulus, fracture toughness if applicable

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Photocatalytic gas-phase alcohol reforming
  • not set

    Specifications:

    • Heated aluminum flat-plate reactor
    • Defined catalyst layers by spray coating on quarz glass plates
    • Array of 30 UV-LEDs (365 nm)
    • Continous operation mode
    • Continous gas analysis using FTIR-spectroscopy and TCD detector

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Photoluminescence
  • not set

    Location: RUB, NB
    Group: AFP
    Contact: Prof. Andreas D. Wieck
    Email: lsafp[at]ruhr-uni-bochum[dot]de

Photoreactor - liquid phase
  • not set

    Specifications:

    • Liquid-phase photocatalytic reactions
    • Double-walled temperated glass reactor
    • Semi-batch operation mode
    • 500 W Hg lamp / 150 W Xe-lamp
    • Online gas analysis (O2, H2, CO2)

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Plasma-assisted oxidation of VOCs in air
  • not set

    Specifications:

    • Plasma-assisted oxidation of VOCs in air
    • Plasma source: Twin-surface dielectric barrier discharge with high voltage pulses of up to 12 kV
    • Coupled with a QMS and a multi channel analyzer for H2, CH4, CO, CO2, O2, O2-trace and n-butane
    • Optical access for spectroscopic plasma characterization
    • Electrical characterization via oscilloscope with high voltage and current probe
    • Real-time monitoring of power dissipation

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Plasma-Assisted Pyrolysis of Methane
  • not set

    Specifications:

    • From methane to hydrogen with nanocarbon materials and acetelyne as byproducts
    • Both low temperature microwave plasma and gliding arc plasma can be tested
    • Inlet flow rate of methane up to 100 L/min, large capacity
    • particle separation with cyclone and filters
    • Coupled with multi-channel analyzer for hydrogen, methane, ethylene and acetylene
    • Optical access for spectroscopic plasma characterization

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Plasma-assisted removal of oxygen from hydrogen-rich gas streams
  • not set

    Specifications:

    • plasma-assisted removal of oxygen from hydrogen-rich gas streams
    • Plasma source: Twin-surface dielectric barrier discharge with high voltage pulses of up to 12 kV
    • Coupled with a QMS and a multi channel analyzer for H2, CH4, CO, CO2, O2, O2-trace and n-butane
    • Optical access for spectroscopic plasma characterization
    • Electrical characterization via oscilloscope with high voltage and current probe
    • Real-time monitoring of power dissipation

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Powder Rheometer
  • Freeman FT4

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

Powder X-ray
  • Bruker D2

    Location: RUB, NC
    Group: AC12
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Quenching and forming dilatometer
  • TA DIL805 V10.2

    Specifications:

    Quenching dilatometer

    • Temperature range: -150 °C - 1500 °C
    • Heating principle: inductive
    • Specimen material: electrically conductive solids
    • Specimen geometry: cylindrical solid/hollow specimens (d = 4 mm and l = 10 mm)
    • Atmosphere: inert gas, vacuum, air
    • Heating rate: max. 4000 K/s
    • Cooling rate: max. 2500 K/s (for hollow specimens)

    Forming dilatometer

    • Temperature range: 20°C - 1500 °C
    • Heating principle: inductive
    • Specimen material: electrically conductive solids
    • Atmosphere: inert gas, vacuum, air
    • Specimen geometry: solid specimens with d = 5 mm and l = 10 mm
    • Heating rate: max. 100 K/s
    • Cooling rate: max. 100 K/s
    • Forming force: max. 20 kN
    • Deformation speed: 0.001- 200 mm/s
    • Forming speed ϕ- 0.001 - 20 s-1
    • Forming degree ϕ: 0.005 - 2
    • Forming path: up to 3 mm residual sample length
    • Number of deformation steps: any
    • min. Pause between the deformation steps: 40 ms

    Application:

    • Preparation of ZTA, ZTU as well as forming ZTU diagrams (UZTU) of metallic alloys [SEP 1680, 3rd edition/1990].
    • calculation of flow curves and simulation of practical forging and rolling processes
    • Investigation of high-temperature creep and relaxation processes

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Raman Microscope
  • Renishaw in Via

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

Raman spectrometer
  • not set

    Specifications: 785nm pump wavelength

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Raman Spectroscopy (2020)
  • not set

    Specifications:

    • High resolution Raman spectrometer from Horiba Scientific
    • Open and tethered microscope with video camera for sample viewing
    • Three different laser excitation wavelengths to avoid fluorescence excitation
    • Operando Raman spectroscopy using Wirbelbett-Microreactor for gas phase reaction of up to 1000 °C
    • Coupled with mass spectrometer for product analysis
    • Software-controlled fast cofocal Raman-Mapping

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Reflected light microscope
  • not set

    Specifications:

    • Magnification levels: 50x / 100x / 200x / 500x / 1000x
    • Magnification gain of the tube: 1x / 1.25x /1.5x /2x
    • Camera: 4,9MP
    • DIC contrast adjustable
    • Function for multifocus integrated

    Application:

    • Examination of ground sections
    • Preparation of specimen images
    • sizing of individual sample components
    • Checking the preparation process
    • Compensation for poor plane parallelism

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Rubber-Wheel
  • ASTM G65

    Specifications:

    • Rubber-coated steel wheel with a hardness of 60 Shore-A.
    • Sample size: approx. 76x25x12.5 mm
    • Sand flow rate: 300-330 g/min (sand)
    • speed: 200 rpm
    • pressing force: 130 N
    • wear path: 1436 m

    Application:

    • Evaluation of the wear resistance
    • determination of mass removal and volume loss after abrasive wear
    • Subsequent investigations of wear surfaces possible

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Scanning Electrochemical Cell Microscope
  • not set

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Scanning Electron Micoscope
  • Jeol JSM-7200F

    Specifications:

    • HT: 0.1 ÷ 30 kV
    • Max. beam current > 600 nA
    • Resolution: 1 nm@30 kV, 1.6 nm@1 kV
    • Detectors: SE, BSE, In-lens SE and BSE
    • Analytical detectors: WDX, EDX, EBSD/TKD

    Features:

    • In-lens Schottky FEG
    • Through-the-lens detectors with energy filter
    • Aberration correction lens

    Application:

    • Imaging
    • Spectroscopy: EDX, WDX
    • Diffraction

    Location: RUB, ZGH
    Group: ZGH
    Contact: Dr. Aleksander Kostka
    Email: aleksander[dot]kostka[at]ruhr-uni-bochum[dot]de

Scanning Electron Microscope
  • not set

    Location: RUB, NB
    Group: EP IV
    Contact: Prof. Anna Böhmer
    Email: sekretariat-ep4[at]physik[dot]rub[dot]de

  • TESCAN MIRA3

    Specifications:

    Magnifications from 2x to 1,000,000x

    • The choice of different imaging detectors allows a high-resolution characterisation of the microstructure.
    • Detectors in the contrast types secondary electrons (SE) or backscatter electrons (BSE) can be used.
    • Special raster techniques allow panoramic images with low magnifications and high depth of field up to the highest resolution investigations of the microstructure in the nm range.
    • In addition, high-resolution overview images can be taken by means of "stage rasterisation", in which the sample stage moves automatically and combines many individual images into one image at the highest magnification.

    Field emission cathode

    • A modern field emission cathode (Fe) is used for high-resolution scanning electron beam microscopy with a resolution in the sub-µm range, combined with reliable chemical and crystallographic electron beam microanalysis using EDX, WDX or EBSD.
    • Accelerating voltage Ua = 200 V - 30 kV
    • Beam current IB = 2 pA - 200 nA
    • Vacuum p = < 9x10-3 Pa

    High-current mode

    • The field emission cathode can be operated in high current mode, reaching a beam current of the order of modern microprobes
    • High beam current of up to 200 nA.
    • This enables the combination of the advantages of a high-resolution SEM and a highly sensitive microprobe with low-noise and reliable electron beam microanalysis, while at the same time providing the high resolution and small beam diameters typical of the field emmision cathode.

    Large sample chamber GM 340x320x310mm

    High resolution scanning electron microscopy on smallest structures up to larger components, demonstrators or damage cases

    Integrated plasma cleaner and liquid nitrogen cooled (-196 C°) cold trap

    • In-situ plasma cleaning of samples and sample chamber
    • Minimisation of carbon contamination and other atmospheric contaminants

    Application:

    • Quick and precise measurement of individual indentations using autofocus and automatic evaluation.
    • Measurements in the load range between macro, small load or micro hardness 0.005kg - 62.5kg.
    • Hardness mapping and trajectories on large samples and workpieces, using the automated cross table and overview camera.

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

  • Zeiss EVO MA10

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

Scanning electron microscope / EBL
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

Scanning electron microscope / electron beam lithography system
  • not set

    Location: RUB, ID
    Group: MST
    Contact: Prof. Dr.-Ing. Martin Hoffmann
    Email: martin[dot]hoffmann-mst[at]rub[dot]de

Scanning electron microscopy
  • FEI eSEM Dual Beam™ Quanta 3D FEG

    Specifications: EDX, gas pressure cell, temperature control

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Scanning Ion Microscopy
  • not set

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Scanning Probe Microscope
  • Bruker Fast Scan

    Location: RUB, ZGH
    Group: ZGH
    Contact: M.Sc. Xiao Wang

Scanning probe microscope (AFM, STM, MFM)
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

Scanning probe microscopes (AFM, MFM)
  • not set

    Location: RUB, ID
    Group: MST
    Contact: Prof. Dr.-Ing. Martin Hoffmann
    Email: martin[dot]hoffmann-mst[at]rub[dot]de

Scanning tunneling microscopy
  • STM 150 Aarhus

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Scanning tunnelling microscope
  • JSPM-4500S

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Seiko Instruments Exstar 6000 TG-DTA-6200
  • not set

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

SEM & EDX
  • FEI, Quanta 3D FEG

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Semi-Automatic Hardness tester
  • Makro Vickers ZHV30-S

    Location: RUB, IC
    Group: HAM
    Contact: Prof. Dr.-Ing. Jan T. Sehrt
    Email: ham[at]ruhr-uni-bochum[dot]de

Servo-hydraulic testing machine
  • Schenck PC160/400

    Specifications:

    • Tensile, compression, bending tests up to 400KN
    • For dynamic tests: cyclic loading with corresponding test frequency

    Application:

    • Threshold load tests in tension and compression
    • Alternating load tests with tensile or compressive components

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Setup for steady-state and transient kinetic studies on the nonoxidative gas-phase dehydrogenation of methanol
  • not set

    Specifications:

    • Simultaneous dosing of the gaseous and liquid reactants using an evaporator
    • Online FTIR analytics extended with the GC for detection of a broad spectrum of the reaction products
    • Fixed bed tubular quartz reactor with the direct temperature control in the catalyst bed

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Solid state ATR-FTIR spectroscopy
  • Nicolet 6700

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Solid state NMR spectrometer
  • Bruker Avance NEO 400 MHz WB-Spektrometer

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

Spatial light modulators
  • not set

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Spectroelectrochemistry
  • not set

    Specifications: GAMRY Reference 600 Potentiostat with a Spectroelectrochemical UV-vis flow cell (SEC-2F) as well as a custom made IR cell. In addition the system is equipped with the DigiElch simulation software

    Location: RUB, NC
    Group: AC4
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Spectrometer
  • Shimadzu UV-VIS-NIR Spectrometer, UV-3600Plus

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

Spectrometer-Reflectometry
  • F-30 Spectrometer-Reflectometry

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

Spinsolve 80 Benchtop NMR
  • not set

    Specifications: Magritek Spinsolve 60 Benchtop NMR suitable for 1H, 31P and 19F NMR spectroscopy. The flow cell enables the connection with our electrochemical setups.

    Location: RUB, NC
    Group: AC2
    Contact: Prof. Dr. Ulf-Peter Apfel
    Email: ac1[at]rub[dot]de

Stereomicroscope
  • Leica M80

    Specifications:

    • Magnification levels: 3.8x-70x adjustable in 20 steps
    • Camera: 4.9MP
    • Light intensity adjustable in steps
    • Light module for different illumination angles available

    Application:

    • Examination of larger components and damaged areas
    • Examination of larger sections
    • Creation of macro images
    • Dimensioning of components

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Stokes polarimeter
  • not set

    Specifications: Polarisation measurements with 0.01% (10-4) accuracy

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Streak camera
  • not set

    Specifications:

    • 2ps time resolution in synchroscan mode
    • slow single sweep unit up to 20ps time resolution

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

Surface plasmon resonance
  • Autolab Twingle

    Specifications: standard and EC cuvette

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

SynAlko: Synthetic alcohol from high pressure syngas
  • not set

    Specifications:

    • Catalytic studies with high pressure syngas
    • Online GC analysis with double FID, coupled with a DEANs switch) and single TCD
    • Cooling trap to condensate products attached to the exhaust
    • Setup is used to perfomr kinetic investigations (partial pressures, temperature, residence time and total pressure)
    • Single zone tube furnace (up to 1000 °C) and backpressure regulator (up to 60 bar)
    • 250 mm long 1/4 stainless steel reactor coated with a thin film of silica
    • About 5 cm isothermal zone and up to 250 mg catalysts

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Temperature conductivity measurement
  • Linseis LFA 1000

    Specifications:

    • Manufacturer: Company Linseis Messgeräte GmbH
    • measuring temperature: approx. -100°C to 550°C (low temperature range) and approx. 20°C to 1000°C (high temperature range)
    • Atmospheres: Intertgas, vacuum
    • Pulse source: Ng: YAG laser with 25J/pulse
    • measuring equipment: infrared detector
    • Sample geometry (depending on holder):
    • Square: 9.5 x 9.5 mm to 10 x 10 mm
    • Round: 9.5 to 10 mm diameter
    • Thickness: 0.7 to 3 mm (depending on material)

    Application: Measurement of thermal diffusivity

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Temperature-Programmed Techniques (TPR, TPO, TPD, TPSR)
  • not set

    Specifications:

    • Multiple custom-made setups for different purposes
    • Important for catalyst studies
    • oxidation, reduction, desorption, surface reactions
    • Different gas detectors for quick and precise measurements

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Thermogravimetry: Cahn TG 2131
  • not set

    Specifications:

    • Temperature up to 1000 °C, heating rate 1-100 K/min
    • Coupled with QMS to monitor composition of effluent gas stream
    • Inert or oxidative atmosphere

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Thermogravimetry: Magnetic Suspension Balance
  • not set

    Specifications:

    • Detection of mass changes during reaction
    • Different investigations of up to 1100 °C
    • Heating rates of 1-20 K/min
    • Various reaction gases applicable
    • Coupled with QMS for gas analysis

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

Three-electrode measuring cells
  • VoltaLab PGP201/PGZ301

    Specifications:

    • Two three-electrode measuring cell: A - electrolyte: H_2 〖SO〗_4, B -electrolyte: 0.9% NaCl solution.
    • Working electrode: A - planar, max. Ø 10 mm, thickness max. 3 mm, B - embedded samples max. Ø 10 mm, thickness max. 8 mm; non-embedded samples do not have to have a specific geometry.
    • counter electrode: platinum sheet
    • reference electrode: calomel electrode (working voltage +244 mV)
    • potentiostat: A - VoltaLab PGP201, B - VoltaLab PGZ301
    • gas purging: air (oxygen), nitrogen

    Application:

    • Investigation of the pitting corrosion behaviour of metallic materials
    • Investigation of the contact corrosion behaviour
    • Investigation of the impedance behaviour
    • Characterisation of the corrosion behaviour under body-like conditions
    • Characterisation of the capacitive behaviour of a coating

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Traction unit
  • Zwick/Roell Z100

    Specifications:

    • Test force: 100 kN
    • Test space (hxw): 1360x640 mm
    • drive power: 4 kW
    • crosshead speed vmin: 0.001 mm/min
    • traverse speed vmax: 200 mm/min
    • Temperature chamber: -100 to +600 °C

    Application: Tensile, compression, bending tests

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

Transducers for vibration analysis
  • not set

    Specifications:

    • force transducers
    • accelerometers
    • laser vibrometer

    Location: RUB, IC
    Group: MAS
    Contact: Prof. Dr.-Ing. Tamara Nestorović
    Email: mas[at]rub[dot]de

Transmission Electron Microscope
  • JEOL JEM ARM200F

    Specifications:

    • HT: 80, 200kV, Cold FEG
    • Resolution: 80pm@200kV, 100pm@80kV
    • EDX 2 × 100mm2, resolution ≤ 133eV
    • EELS resolution ≤ 0.3eV

    Features:

    • Probe forming Cs-corrector with auto-alignment system
    • E-ABF Enhanced light atom contrast
    • Piezo controlled stage; tilt ±35° in a and ±30° in b
    • CMOS 4k camera
    • Atomic resolution EDS system
    • Simultaneous EDX and EELS acquisition
    • Atomic resolution EDS system
    • TEM / STEM tomography
    • Precession diffraction (PED)
    • ASTAR system
    • 3D electron diffraction tomography

    Application:

    • Diffraction contrast
    • Electron diffraction
    • HR-TEM, HR-STEM
    • Spectroscopy: EDX, EELS
    • TEM/STEM tomography
    • Correlative TEM/APT

    Location: RUB, ZGH
    Group: ZGH
    Contact: Dr. Aleksander Kostka
    Email: aleksander[dot]kostka[at]ruhr-uni-bochum[dot]de

Tribocorrosion test stand
  • UMT3 Bruker

    Specifications:

    • Sample size: 15x15x2 mm
    • Counterbody: Ø 5-8 mm, material freely selectable
    • Electrolyte: almost freely selectable, for tribocorrosion investigations conductive electrolytes
    • load: 0.5-50 N
    • wear rate: 0.01-10 mm/s
    • Wear path for tribocorrosion: 2 mm

    Application:

    • Characterisation of the sliding wear behaviour with media lubrication and dry running
    • Characterisation of the corrosion behaviour Characterisation of the tribocorrosion behaviour, including wear-related corrosion and corrosion-related wear
    • Determination of the coefficient of friction with media lubrication and in dry operation
    • Subsequent investigation of the wear mechanisms and corrosion phenomena possible

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

UHV-Fourier transform infrared spectroscope
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

Ulbricht sphere
  • Gigahertz Optik 500mm

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

Ultrasonic resonance spectrometer
  • own development

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

Ultrasonic wire bonder
  • not set

    Location: RUB, ID
    Group: Nano
    Contact: Prof. Dr.-Ing. Ulrich Kunze
    Email: ulrich[dot]kunze[at]ruhr-uni-bochum[dot]de

USB spectrometers
  • not set

    Specifications: VIS and IR

    Location: RUB, ID
    Group: PTT
    Contact: Prof. Martin R. Hofmann
    Email: ptt+office[at]rub[dot]de

UV-Vis Spectroscopy
  • not set

    Specifications:

    • Absorption and transmission of liquid samples
    • Diffuse reflectance measurements of solid samples
    • Concentration of coloured complexes/metals/ions
    • Band gap determination of semiconductors (Kubelka-Munk theory)
    • Measurement of plasmon resonance
    • 200 - 900 nm

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

UV/VIS spectrometer
  • Shimadzu UV-2450

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

UV/Vis spectroscopy
  • Agilent Cary 60

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

  • Eppendorf BioSpectrometer

    Location: RUB, ZEMOS
    Group: NanoEC
    Contact: Prof. Dr. Kristina Tschulik
    Email: nanoec[at]rub[dot]de

Vertical dilatometer
  • Linseis L75V-PT

    Specifications:

    • measuring temperature: approx. -150°C to 600°C (low temperature range) and approx. 150°C to 1550°C (high temperature range)
    • atmospheres: Vacuum (approx. 10-3 mBar), high vacuum (approx. 10-5 mBar), N2, He, Ar (each up to approx. 1.3 bar).
    • Sample geometries: Sample: diameter up to approx. 10 mm, length up to approx. 50 mm; powder: approx. 3 to 5mm full height in crucible.

      Application:

      • Measurement of dimensional changes (shrinkage, expansion)
      • Determination of the thermal expansion coefficient
      • Sintering process evaluation
      • Volumetric conversion points

      Location: RUB, ICFO
      Group: Wtech
      Contact: Prof. Dr. Sebastian Weber
      Email: lwt[at]wtech[dot]rub[dot]de

White Light Interferometry Microscope
  • Polytec TMS-1200

    Location: RUB, ID
    Group: LAT
    Contact: Prof. Dr.-Ing. habil. Andreas Ostendorf
    Email: sekretariat-lat[at]ruhr-uni-bochum[dot]de

X-Ray Diffraction with in situ cell
  • Bruker D8

    Specifications:

    • instrument with in situ high temperature cell from Anton Paar
    • 0 to 130 degree two theta range, Anti-airscatter slit
    • Reflection or transmission geometry
    • In situ measurements of up to 900 °C, 3 mbar to 10 bar
    • Zero-background holders for very small sample amounts

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

X-Ray Diffractometer
  • not set

    Location: RUB, NB
    Group: EP IV
    Contact: Prof. Anna Böhmer
    Email: sekretariat-ep4[at]physik[dot]rub[dot]de

  • Bruker, D8 Discover

    Location: RUB, ZGH
    Group: ZGH
    Contact: M.Sc. Tobias Piotrowiak
    Email: tobias[dot]piotrowiak[at]rub[dot]de

X-ray Photoelectron Spectroscopy
  • not set

    Location: RUB, NC
    Group: PC 1
    Contact: Prof. Dr. Karina Morgenstern
    Email: sekretariat[at]pc[dot]rub[dot]de

  • not set

    Specifications:

    • Chemical analysis of solid surface
    • Monochromatic Al Kα X-ray source (1486.6 eV, anode operating at 14.5 kV and 30 mA)
    • High-resolution Gammadata-Scienta SES 2002 hemispherical analyser
    • Ar sputtering to remove surface layers
    • Pretreatment reactor with resistance heating under H2, CO or dilute O2 of up to 1 bar
    • Fixed transition mode with pass energies of 200 and 500 eV

    Location: RUB, NBCF
    Group: TECHEM
    Contact: Prof. Dr. Martin Muhler
    Email: ltc[at]techem[dot]rub[dot]de

X-ray powder diffractometer
  • Bruker Advance D8

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

  • Siemens D5000

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

  • STOE STADI MP

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

X-ray single crystal diffractometer
  • Xcalibur von Oxford Diffraction

    Location: RUB, IA
    Group: Kristall
    Contact: Prof. Dr. Jürgen Schreuer
    Email: carla[dot]werner[at]rub[dot]de

X-Ray Tomography
  • RX Solutions  EasyTom

    Location: RUB, ZGH
    Group: ZGH
    Contact: M.Sc. Johannes Boes

X-Ray-Diffraction
  • Bruker D8 Advanced

    Specifications:

    • Bragg-Brentano geometry with theta/theta arrangement
    • operating voltage/current: 40 kV, 40 mA
    • Goniometer radius: 280 mm
    • max. resolution (FWHM): 0.0001° - sample rotation for intensity increase
    • Sample rotation for intensity increase possible
    • Cu-tube: Cu-Kα-radiation (secondary Ni-filter)
    • Flipstick sample holder (9-fold sample holder).
    • Sample requirement: crystalline material, solid as well as powder samples possible

    Application:

    • Qualitative phase analysis
    • Quantitative phase analysis

    Location: RUB, ICFO
    Group: Wtech
    Contact: Prof. Dr. Sebastian Weber
    Email: lwt[at]wtech[dot]rub[dot]de

XRD
  • Bruker AXS D8 Advance XRD

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

  • Bruker AXS D8 Discover XRD

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

  • X’Pert Pro MRD (Panalytical) XRD

    Location: RUB, NC
    Group: IMC
    Contact: Prof. Dr. Anjana Devi
    Email: anjana[dot]devi[at]rub[dot]de

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